"Analog fault coverage improvement using final-test dynamic part average ..."

Wim Dobbelaere et al. (2016)

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DOI: 10.1109/TEST.2016.7805829

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen:
Analog fault coverage improvement using final-test dynamic part average testing. ITC 2016: 1-9

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