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"Modeling the probability of defect excitation for a commercial IC with ..."
Jennifer Dworak et al. (1999)
- Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer:
Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. ITC 1999: 1031-1037
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