"Analysis and Detection of Timing Failures in an Experimental Test Chip."

Piero Franco et al. (1996)

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DOI: 10.1109/TEST.1996.557127

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell:
Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC 1996: 691-700

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