"RF (gigahertz) ATE production testing on wafer: options and tradeoffs."

Dean A. Gahagan (1999)

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DOI: 10.1109/TEST.1999.805760

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dean A. Gahagan:
RF (gigahertz) ATE production testing on wafer: options and tradeoffs. ITC 1999: 388-395

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