"Challenges for High Volume Testing of Embedded IO Interfaces in ..."

Esteban Garita-Rodríguez, Renato Rimolo-Donadio, Rafael Zamora-Salazar (2022)

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DOI: 10.1109/ITC50671.2022.00053

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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Esteban Garita-Rodríguez, Renato Rimolo-Donadio, Rafael Zamora-Salazar:
Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products. ITC 2022: 456-464

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