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"Weighted random test program generation for a per-pin tester."
J. Gartner et al. (1990)
- J. Gartner, B. Driscoll, Donato O. Forlenza, Orazio P. Forlenza, Timothy J. Koprowski, T. Lizambri, R. Olsen, S. Robertson, P. Ryan, A. Walter:
Weighted random test program generation for a per-pin tester. ITC 1990: 1000-1005
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