"Compact two-pattern test set generation for combinational and full scan ..."

Ilker Hamzaoglu, Janak H. Patel (1998)

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DOI: 10.1109/TEST.1998.743288

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ilker Hamzaoglu, Janak H. Patel:
Compact two-pattern test set generation for combinational and full scan circuits. ITC 1998: 944-953

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