"Variation and failure characterization through pattern classification of ..."

Chun-Kai Hsu et al. (2016)

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DOI: 10.1109/TEST.2016.7805845

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

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Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng:
Variation and failure characterization through pattern classification of test data from multiple test stages. ITC 2016: 1-10

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