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"Case study of scan chain diagnosis and PFA on a low yield wafer."
Yu Huang et al. (2010)
- Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen:
Case study of scan chain diagnosis and PFA on a low yield wafer. ITC 2010: 818
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