"Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic ..."

Hanjun Jiang et al. (2004)

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DOI: 10.1109/TEST.2004.1387413

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger:
Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. ITC 2004: 1379-1388

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