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"An on-chip ADC BIST solution and the BIST enabled calibration scheme."

Xiankun Jin et al. (2017)

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DOI: 10.1109/TEST.2017.8242032

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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  dblp key:
  - conf/itc/JinCJBKGGC17
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  - https://dblp.org/rec/conf/itc/JinCJBKGGC17
Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen:
An on-chip ADC BIST solution and the BIST enabled calibration scheme. ITC 2017: 1-10

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