"Automatic Test Program Generation for Mixed Signal ICs via Design to Test ..."

William Kao, Jean Xia, Tom Boydston (1992)

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DOI: 10.1109/TEST.1992.527911

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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William Kao, Jean Xia, Tom Boydston:
Automatic Test Program Generation for Mixed Signal ICs via Design to Test Link. ITC 1992: 860-865

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