"Isolating Failures within VLSI Chips That Incorporate Signature Analysis ..."

Frances D. Koo, Gene W. Lee (1985)

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type: Conference or Workshop Paper

metadata version: 2002-11-11

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Frances D. Koo, Gene W. Lee:
Isolating Failures within VLSI Chips That Incorporate Signature Analysis and Set/Scan Techniques. ITC 1985: 372-379

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