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"An advanced test system architecture for synchronous and asynchronous ..."
Jun Kurita, Nobuyuki Kasuga, Kiyoyasu Hiwada (1990)
- Jun Kurita, Nobuyuki Kasuga, Kiyoyasu Hiwada:
An advanced test system architecture for synchronous and asynchronous control of mixed signal device testing. ITC 1990: 508-513
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