"Non-Stuck-At Fault Detection in nMOS Circuits by Region Analysis."

Michael G. Lamoureux, Vinod K. Agarwal (1983)

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type: Conference or Workshop Paper

metadata version: 2002-11-05

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Michael G. Lamoureux, Vinod K. Agarwal:
Non-Stuck-At Fault Detection in nMOS Circuits by Region Analysis. ITC 1983: 129-137

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