"Using on-chip test pattern compression for full scan SoC designs."

Helmut Lang, Jens Pfeiffer, Jeff Maguire (2000)

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DOI: 10.1109/TEST.2000.894258

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Helmut Lang, Jens Pfeiffer, Jeff Maguire:
Using on-chip test pattern compression for full scan SoC designs. ITC 2000: 638-643

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