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"Issues on Test Optimization with Known Good Dies and Known Defective Dies ..."

Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir (2006)

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DOI: 10.1109/TEST.2006.297640

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-15

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Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir:
Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective. ITC 2006: 1-10

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