"A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy."

Jin-Fu Li et al. (2003)

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DOI: 10.1109/TEST.2003.1270863

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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  - https://dblp.org/rec/conf/itc/LiYHWTHC03
Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow:
A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. ITC 2003: 393-402

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