"Fault models and test methods for subthreshold SRAMs."

Chen-Wei Lin et al. (2010)

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DOI: 10.1109/TEST.2010.5699245

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Chen-Wei Lin, Hung-Hsin Chen, Hao-Yu Yang, Mango Chia-Tso Chao, Rei-Fu Huang:
Fault models and test methods for subthreshold SRAMs. ITC 2010: 427-436

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