"Clock-gating-aware low launch WSA test pattern generation for at-speed ..."

Yi-Tsung Lin, Jiun-Lang Huang, Xiaoqing Wen (2011)

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DOI: 10.1109/TEST.2011.6139132

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yi-Tsung Lin, Jiun-Lang Huang, Xiaoqing Wen:
Clock-gating-aware low launch WSA test pattern generation for at-speed scan testing. ITC 2011: 1-7

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