"An Algorithmic Approach to the Testing of a Wafer Scale Integrated (WSI) ..."

Neal H. MacDonald, Gordon B. Neish (1982)

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type: Conference or Workshop Paper

metadata version: 2004-03-30

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Neal H. MacDonald, Gordon B. Neish:
An Algorithmic Approach to the Testing of a Wafer Scale Integrated (WSI) Circuit. ITC 1982: 590-600

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