"Transient Power Supply Current Testing of Digital CMOS Circuits."

Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle (1995)

Details and statistics

DOI: 10.1109/TEST.1995.529922

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics