"Systematic Characterization of Physical Defects for Fault Analysis of MOS ..."

Wojciech Maly, F. Joel Ferguson, John Paul Shen (1984)

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type: Conference or Workshop Paper

metadata version: 2002-11-22

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Wojciech Maly, F. Joel Ferguson, John Paul Shen:
Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells. ITC 1984: 390-399

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