"Fabrication Defects and Fault Models for DNA Self-Assembled Nanoelectronics."

Vincent Mao, Chris Dwyer, Krishnendu Chakrabarty (2008)

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DOI: 10.1109/TEST.2008.4700634

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Vincent Mao, Chris Dwyer, Krishnendu Chakrabarty:
Fabrication Defects and Fault Models for DNA Self-Assembled Nanoelectronics. ITC 2008: 1-10

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