"The testability features of the MCF5407 containing the 4th generation ..."

Teresa L. McLaurin, Frank Frederick (2000)

Details and statistics

DOI: 10.1109/TEST.2000.894202

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics