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"Test Pattern Considerations for Fault Tolerant High Density DRAM."
Hiroshi Miyamoto et al. (1985)
- Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, T. Nakano:
Test Pattern Considerations for Fault Tolerant High Density DRAM. ITC 1985: 451-455
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