"Design for testability features of the SUN microsystems niagara2 CMP/CMT ..."

Robert F. Molyneaux et al. (2007)

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DOI: 10.1109/TEST.2007.4437561

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Robert F. Molyneaux, Thomas A. Ziaja, Hong Kim, Shahryar Aryani, Sungbae Hwang, Alex Hsieh:
Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip. ITC 2007: 1-8

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