"Test Time and Area Optimized BrST Scheme for Automotive ICs."

Nilanjan Mukherjee et al. (2019)

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DOI: 10.1109/ITC44170.2019.9000133

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-01

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Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki:
Test Time and Area Optimized BrST Scheme for Automotive ICs. ITC 2019: 1-10

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