"EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End ..."

Vishwanath Natarajan et al. (2008)

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DOI: 10.1109/TEST.2008.4700603

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee:
EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms. ITC 2008: 1-10

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