"Novel Eye Diagram Estimation Technique to Assess Signal Integrity in ..."

Youngsu Oh et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ITC44778.2020.9325279

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/OhHGLJ20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/OhHGLJ20
Youngsu Oh, Dongmin Han, Byeongseon Go, Seungtaek Lee, Woosik Jeong:
Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test. ITC 2020: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.