"A Universal Technique for Accelerating Simulation of Scan Test Patterns."

Bejoy G. Oomman, Wu-Tung Cheng, John A. Waicukauski (1996)

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DOI: 10.1109/TEST.1996.556955

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/OommanCW96
Bejoy G. Oomman, Wu-Tung Cheng, John A. Waicukauski:
A Universal Technique for Accelerating Simulation of Scan Test Patterns. ITC 1996: 135-141

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