"Empirical failure analysis and validation of fault models in CMOS VLSI."

Ashish Pancholy, Janusz Rajski, Larry J. McNaughton (1990)

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DOI: 10.1109/TEST.1990.114114

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ashish Pancholy, Janusz Rajski, Larry J. McNaughton:
Empirical failure analysis and validation of fault models in CMOS VLSI. ITC 1990: 938-947

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