"High Speed IO Access for Test forms the foundation for Silicon Lifecycle ..."

Amit Pandey, Brendan Tully, Karthikeyan Natarajan (2022)

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DOI: 10.1109/ITC50671.2022.00092

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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Amit Pandey, Brendan Tully, Karthikeyan Natarajan:
High Speed IO Access for Test forms the foundation for Silicon Lifecycle Management. ITC 2022: 656-660

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