"Design-for-test methods for stand-alone SRAMs at 1 Gb/s/pin and beyond."

Harold Pilo et al. (2000)

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DOI: 10.1109/TEST.2000.894235

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Harold Pilo, Stu Hall, Patrick Hansen, Steve Lamphier, Chris Murphy:
Design-for-test methods for stand-alone SRAMs at 1 Gb/s/pin and beyond. ITC 2000: 436-443

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