"Fast test generation for circuits with RTL and gate-level views."

Srivaths Ravi, Niraj K. Jha (2001)

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DOI: 10.1109/TEST.2001.966733

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Srivaths Ravi, Niraj K. Jha:
Fast test generation for circuits with RTL and gate-level views. ITC 2001: 1068-1077

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