


default search action
"Practical scan test generation and application for embedded FIFOs."
Jeff Rearick (1999)
- Jeff Rearick:

Practical scan test generation and application for embedded FIFOs. ITC 1999: 294-300

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.


Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID













