"Analytical test of 3D integrated circuits."

Raphael Robertazzi et al. (2017)

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DOI: 10.1109/TEST.2017.8242067

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-05

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Raphael Robertazzi, Micheal Scheurman, Matt Wordeman, Shurong Tian, Christy Tyberg:
Analytical test of 3D integrated circuits. ITC 2017: 1-10

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