"Built-in self-test in a 24 bit floating point digital signal processor."

Narumi Sakashita et al. (1990)

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DOI: 10.1109/TEST.1990.114106

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Narumi Sakashita, Hisako Sawai, Eiichi Teraoka, Toshiki Fugiyama, Toru Kengaku, Yukihiko Shimazu, Takeshi Tokuda:
Built-in self-test in a 24 bit floating point digital signal processor. ITC 1990: 880-885

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