"Enhanced Probe Card Facilities At-Speed Wafer Probing in Very High Density ..."

Eswar Subramanian, Randy Nelson (1992)

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DOI: 10.1109/TEST.1992.527920

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Eswar Subramanian, Randy Nelson:
Enhanced Probe Card Facilities At-Speed Wafer Probing in Very High Density Applications. ITC 1992: 936-939

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