"Detecting and diagnosing open defects."

Dat Tran et al. (2010)

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DOI: 10.1109/TEST.2010.5699303

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dat Tran, LeRoy Winemberg, Darrell Carder, Xijiang Lin, Joe LeBritton, Bruce Swanson:
Detecting and diagnosing open defects. ITC 2010: 811

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