"Silicon evaluation of longest path avoidance testing for small delay defects."

Ritesh P. Turakhia et al. (2007)

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DOI: 10.1109/TEST.2007.4437564

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke:
Silicon evaluation of longest path avoidance testing for small delay defects. ITC 2007: 1-10

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