"30-Gb/s optical and electrical test solution for high-volume testing."

Daisuke Watanabe et al. (2013)

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DOI: 10.1109/TEST.2013.6651887

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Daisuke Watanabe, Shin Masuda, Hideo Hara, Tsuyoshi Ataka, Atsushi Seki, Atsushi Ono, Toshiyuki Okayasu:
30-Gb/s optical and electrical test solution for high-volume testing. ITC 2013: 1-10

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