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"A novel scheme to reduce power supply noise for high-quality at-speed scan ..."
Xiaoqing Wen et al. (2007)
- Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang:
A novel scheme to reduce power supply noise for high-quality at-speed scan testing. ITC 2007: 1-10
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