"Optimizing the flattened test-generation model for very large designs."

Peter Wohl, John A. Waicukauski (2000)

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DOI: 10.1109/TEST.2000.894263

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Peter Wohl, John A. Waicukauski:
Optimizing the flattened test-generation model for very large designs. ITC 2000: 681-690

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