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"A fast and accurate per-cell dynamic IR-drop estimation method for ..."

Yuta Yamato et al. (2012)

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DOI: 10.1109/TEST.2012.6401549

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/YamatoYHI12
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  - https://dblp.org/rec/conf/itc/YamatoYHI12
Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue:
A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation. ITC 2012: 1-8

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