"Detection of Internal Stuck-open Faults in Scan Chains."

Fan Yang et al. (2008)

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DOI: 10.1109/TEST.2008.4700577

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
Detection of Internal Stuck-open Faults in Scan Chains. ITC 2008: 1-10

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