"An economical, precise and limited access In-Circuit Test method for ..."

Albert Yeh, Jesse Chou, Max Lin (2009)

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DOI: 10.1109/TEST.2009.5355755

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Albert Yeh, Jesse Chou, Max Lin:
An economical, precise and limited access In-Circuit Test method for pulse-width modulation (PWM) circuits. ITC 2009: 1-9

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