"A built-in self-test scheme for 3D RAMs."

Yun-Chao You et al. (2012)

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DOI: 10.1109/TEST.2012.6401579

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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  - https://dblp.org/rec/conf/itc/YouCLLKCW12
Yun-Chao You, Che-Wei Chou, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu:
A built-in self-test scheme for 3D RAMs. ITC 2012: 1-9

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