"PCB Defect Recognition and Elimination Based on Secondary Error and ..."

Rui Li et al. (2020)

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DOI: 10.1109/IWCMC48107.2020.9148132

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-04

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Rui Li, Bin Xue, Kun Zhao, Huihui Chu, Benshuang Jiao:
PCB Defect Recognition and Elimination Based on Secondary Error and Statistical Histogram. IWCMC 2020: 1981-1984

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