"Large Language Models for Printed Circuit Board Test Generation."

Albin Lidbäck, Erik Larsson (2025)

> Home

Details and statistics

DOI: 10.1109/LATS65346.2025.10963941

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/latw/LidbackL25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/latw/LidbackL25
Albin Lidbäck, Erik Larsson:
Large Language Models for Printed Circuit Board Test Generation. LATS 2025: 1-2

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.